Strain measurement in thin layer helium implanted polycristal using X-Ray micro diffraction - École des Ponts ParisTech Access content directly
Conference Papers Year : 2014

Strain measurement in thin layer helium implanted polycristal using X-Ray micro diffraction

Abstract

The swelling of nuclear fuel (uranium dioxide, UO2) in storage conditions is partly due to the alpha decay (helium production) of radioactive fission products. In order to study the behaviour of spent fuel, helium ions are implanted at the surface of fresh UO2 polycrystalline disks. This technique allows the study of nuclear fuel in storage conditions while dealing with low radioactive samples. X-ray micro diffraction is used to measure the strain in the implanted layer at microscopic scale. A previous work [1,2] showed that the layer displacement depends on the depth z, perpendicular to the sample surface, and three components of the deformation gradient, ξzz, ξyz and ξxz are non-zero. Their values depend on the grain orientation. In this abstract, the sample preparation and image acquisition are first described. Then, an improved procedure for automatic Laue diffraction patterns analysis is presented. Finally a mapping of intragranular strain is shown on few adjacent grains.
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Dates and versions

hal-01022794 , version 1 (10-07-2014)

Identifiers

  • HAL Id : hal-01022794 , version 1

Cite

Marcelle Ibrahim, Etienne Castellier, Michel Bornert, Hervé Palancher, Sabine Caré, et al.. Strain measurement in thin layer helium implanted polycristal using X-Ray micro diffraction. 16th International Conference on Experimental Mechanics, ICEM 16, 7th to 11th July 2014 University of Cambridge UK., 2014, United Kingdom. 2p. ⟨hal-01022794⟩
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