System and method for pattern detection and camera calibration - École des Ponts ParisTech Access content directly
Patents Year : 2012

System and method for pattern detection and camera calibration

Abstract

Detecting a pattern in an image by receiving the image of a pattern and storing the image in a memory, where the pattern is composed of shapes that have geometrical properties that are invariant under near projective transforms. In some embodiments the process detects shapes in the image using the geometrical properties of the shapes, determines the alignment of the various shapes, and, corresponds or matches the shapes in the image with the shapes in the pattern. This pattern detection process may be used for calibration or distortion correction in optical devices.
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Dates and versions

hal-00826448 , version 1 (27-05-2013)

Identifiers

  • HAL Id : hal-00826448 , version 1

Cite

Leonid Rudin, Pablo Muse, Pascal Monasse. System and method for pattern detection and camera calibration. United States, Patent n° : 8,106,968. 2012. ⟨hal-00826448⟩
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