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Operando characterization of conductive filaments during resistive switching in Mott VO 2

Shaobo Cheng , Min-Han Lee , Xing Li , Lorenzo Fratino , Federico Tesler , et al.
Proceedings of the National Academy of Sciences of the United States of America, 2021, 118 (9), pp.e2013676118. ⟨10.1073/pnas.2013676118⟩
Journal articles hal-03323461v1

In-situ electron microscopy study of non-volatile resistive switching in Mott insulator VO 2

Shaobo Cheng , Min-Han Lee , Xing Li , Lorenzo Fratino , Marcelo Rozenberg , et al.
Microscopy and Microanalysis, 2021, 27 (S1), pp.2162-2164. ⟨10.1017/S1431927621007790⟩
Journal articles hal-03323463v1